목록 Coherent electrical readout of defect spins in 4H-SiC by photo-ionization at ambient conditions Authors Matthias Niethammer, Matthias Widmann, Torsten Rendler, Naoya Morioka, Yu-Chen Chen, Rainer Stöhr, Jawad Ul Hassan, Shinobu Onoda, Takeshi Ohshima, Sang-Yun Lee, Amlan Mukherjee, Junichi Isoya, Nguyen Tien Son, and Jörg Wrachtrup Journal Nano Lett. Vol 10 Page 5569 Year 2019 Link https://www.nature.com/articles/s41467-019-13545-z6 118회 연결 Matthias Niethammer, Matthias Widmann, Torsten Rendler, Naoya Morioka, Yu-Chen Chen, Rainer Stöhr, Jawad Ul Hassan, Shinobu Onoda, Takeshi Ohshima, Sang-Yun Lee, Amlan Mukherjee, Junichi Isoya, Nguyen Tien Son, Jörg Wrachtrup, "Coherent electrical readout of defect spins in 4H-SiC by photo-ionization at ambient conditions", Nano letters 10, 5569, (2019).