Journals

Coherent electrical readout of defect spins in 4H-SiC by photo-ionization at ambient conditions
Authors
Matthias Niethammer, Matthias Widmann, Torsten Rendler, Naoya Morioka, Yu-Chen Chen, Rainer Stöhr, Jawad Ul Hassan, Shinobu Onoda, Takeshi Ohshima, Sang-Yun Lee, Amlan Mukherjee, Junichi Isoya, Nguyen Tien Son, and Jörg Wrachtrup
Journal
Nano Lett.
Vol
10
Page
5569
Year
2019
Matthias Niethammer, Matthias Widmann, Torsten Rendler, Naoya Morioka, Yu-Chen Chen, Rainer Stöhr, Jawad Ul Hassan, Shinobu Onoda, Takeshi Ohshima, Sang-Yun Lee, Amlan Mukherjee, Junichi Isoya, Nguyen Tien Son, Jörg Wrachtrup, "Coherent electrical readout of defect spins in 4H-SiC by photo-ionization at ambient conditions", Nano letters 10, 5569, (2019).